F54 Film Thickness Measurement Mapping Instrument
Thin-film thickness of samples up to 450 mm in diameter are mapped quickly and easily with the F54 advanced spectral reflectance system. The motorized r-theta stage moves automatically to selected measurement points and provides thickness measurements as fast as two points per second. Choose one of the dozens of predefined polar, rectangular, or linear map patterns, or create your own with no limit on the number of measurement points. The entire desktop system is set up in minutes and can be used by anyone with basic computer skills.
Description
The F50 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes. The different F50 instruments are distinguished primarily by thickness and wavelength range. The standard F50 is the most popular. Generally shorter wavelengths (e.g. F50-UV) are required for measurement of thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.
1. Thickness Measurement Range: The instrument can measure film thicknesses ranging from approximately 20nm – 45µm, depending on the specific model and configuration.
2. Wavelength Range: The F50 typically operates within a wavelength range of approximately 380-1050nm. This range allows for the measurement of a variety of films, including transparent and semi-transparent thin films.
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